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    1996
    ACM
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    iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips
    13 years 8 months ago
    iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips
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    In this paper, we present the rst chip-level electrothermal simulator, iCET. For a given chip layout, packaging material, user-speci ed input signal patterns, and thermal boundar...
    Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury...
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