Sciweavers

APCSAC
2005
IEEE
13 years 10 months ago
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
Jie Hu, Greg M. Link, Johnsy K. John, Shuai Wang, ...