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    VTS
    1999
    IEEE
    71views Hardware» more  VTS 1999»
    Test Generation for Ground Bounce in Internal Logic Circuitry
    13 years 9 months ago
    Test Generation for Ground Bounce in Internal Logic Circuitry
    Download  poisson.usc.edu
    Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
    Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
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