IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
— In this paper, an innovative self-checking Reed Solomon encoder architecture is described. The presented architecture exploits some properties of the arithmetic operations in G...
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
Selecting a strong cryptographic algorithm makes no sense if the information leaks out of the device through sidechannels. Sensitive information, such as secret keys, can be obtai...
IOLTS
2005
IEEE
13 years 9 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...