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ISQED
2008
IEEE
66views Hardware» more  ISQED 2008»
13 years 11 months ago
An Implementation of Performance-Driven Block and I/O Placement for Chip-Package Codesign
– As silicon technology scales, we can integrate more and more circuits on a single chip, which means more I/Os are needed in modern designs. The flip-chip technology which was ...
Ming-Fang Lai, Hung-Ming Chen
ISQED
2008
IEEE
151views Hardware» more  ISQED 2008»
13 years 11 months ago
Quality of a Bit (QoB): A New Concept in Dependable SRAM
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
Hidehiro Fujiwara, Shunsuke Okumura, Yusuke Iguchi...
ISQED
2008
IEEE
153views Hardware» more  ISQED 2008»
13 years 11 months ago
ILP Based Gate Leakage Optimization Using DKCMOS Library during RTL Synthesis
In this paper dual-K (DKCMOS) technology is proposed as a method for gate leakage power reduction. An integer linear programming (ILP) based algorithm is proposed for its optimiza...
Saraju P. Mohanty
ISQED
2008
IEEE
118views Hardware» more  ISQED 2008»
13 years 11 months ago
A Thermal-Friendly Load-Balancing Technique for Multi-Core Processors
In multi-core processors there are several ways to pair a thread to a particular core. These load-balancing techniques result in a quite different power, performance and thermal b...
Enric Musoll
ISQED
2008
IEEE
150views Hardware» more  ISQED 2008»
13 years 11 months ago
Fundamental Data Retention Limits in SRAM Standby Experimental Results
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...
Animesh Kumar, Huifang Qin, Prakash Ishwar, Jan M....
ISQED
2008
IEEE
117views Hardware» more  ISQED 2008»
13 years 11 months ago
A Basis for Formal Robustness Checking
Correct input/output behavior of circuits in presence of internal malfunctions becomes more and more important. But reliable and efficient methods to measure this robustness are ...
Görschwin Fey, Rolf Drechsler