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ISQED
2009
IEEE
136views Hardware» more  ISQED 2009»
10 years 9 months ago
NBTI aware workload balancing in multi-core systems
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
Jin Sun, Avinash Karanth Kodi, Ahmed Louri, Janet ...
ISQED
2009
IEEE
112views Hardware» more  ISQED 2009»
10 years 9 months ago
Estimation and optimization of reliability of noisy digital circuits
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally ef...
Satish Sivaswamy, Kia Bazargan, Marc D. Riedel
ISQED
2009
IEEE
86views Hardware» more  ISQED 2009»
10 years 9 months ago
Uncriticality-directed scheduling for tackling variation and power challenges
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
Toshinori Sato, Shingo Watanabe
ISQED
2009
IEEE
69views Hardware» more  ISQED 2009»
10 years 9 months ago
Parametric analysis to determine accurate interconnect extraction corners for design performance
In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the ...
Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa ...
ISQED
2009
IEEE
126views Hardware» more  ISQED 2009»
10 years 9 months ago
Robust differential asynchronous nanoelectronic circuits
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Bao Liu
ISQED
2009
IEEE
126views Hardware» more  ISQED 2009»
10 years 9 months ago
New subthreshold concepts in 65nm CMOS technology
In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra lo...
Farshad Moradi, Dag T. Wisland, Hamid Mahmoodi, Al...
ISQED
2009
IEEE
137views Hardware» more  ISQED 2009»
10 years 9 months ago
Active decap design considerations for optimal supply noise reduction
Active decoupling capacitors (decaps) are more effective than passive decaps at reducing local IR-drop problems in the power distribution network. In the basic active decap, two p...
Xiongfei Meng, Resve A. Saleh
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