ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the ...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra lo...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
Active decoupling capacitors (decaps) are more effective than passive decaps at reducing local IR-drop problems in the power distribution network. In the basic active decap, two p...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
