ITC 1989 | Sciweavers

12

ITC
1989
IEEE

82views Hardware» more ITC 1989»

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations

13 years 8 months ago

- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...

Jerry M. Soden, R. Keith Treece, Michael R. Taylor...

claim paper

Read More »

8

click to vote

ITC
1989
IEEE

42views Hardware» more ITC 1989»

Flexible, High-Performance Pin Electronics Implementation

13 years 8 months ago

Download thesis.lib.ncu.edu.tw

Phillip N. King

claim paper

Read More »

12

click to vote

ITC
1989
IEEE

70views Hardware» more ITC 1989»

The Pseudo-Exhaustive Test of Sequential Circuits

13 years 8 months ago

Download www.date.uni-paderborn.de

: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...

Sybille Hellebrand, Hans-Joachim Wunderlich

claim paper

Read More »

7

click to vote

ITC
1989
IEEE

39views Hardware» more ITC 1989»

Prototype Testing Simplified by Scannable Buffers and Latches

13 years 8 months ago