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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
13 years 8 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
ITC
1991
IEEE
92views Hardware» more  ITC 1991»
13 years 8 months ago
Refined Bounds on Signature Analysis Aliasing for Random Testing
Nirmal R. Saxena, Piero Franco, Edward J. McCluske...
ITC
1991
IEEE
88views Hardware» more  ITC 1991»
13 years 8 months ago
Software Testing
Paul D. Roddy
ITC
1991
IEEE
112views Hardware» more  ITC 1991»
13 years 8 months ago
Built-In Self-Diagnostic Read-Only-Memories
Prawat Nagvajara, Mark G. Karpovsky
ITC
1991
IEEE
86views Hardware» more  ITC 1991»
13 years 8 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee