ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE