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ITC
1999
IEEE
105views Hardware» more  ITC 1999»
13 years 8 months ago
Finite state machine synthesis with concurrent error detection
A new synthesis technique for designing finite state machines with on-line parity checking is presented. The output logic and the next-state logic of the finite state machines are...
Chaohuang Zeng, Nirmal R. Saxena, Edward J. McClus...
ITC
1999
IEEE
66views Hardware» more  ITC 1999»
13 years 8 months ago
Robust testability of primitive faults using test points
Ramesh C. Tekumalla, Premachandran R. Menon
ITC
1999
IEEE
103views Hardware» more  ITC 1999»
13 years 8 months ago
Resistive bridge fault modeling, simulation and test generation
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
Vijay R. Sar-Dessai, D. M. H. Walker
ITC
1999
IEEE
66views Hardware» more  ITC 1999»
13 years 8 months ago
High-level ATPG for Early Power Analysis
Wolfgang Roethig
ITC
1999
IEEE
67views Hardware» more  ITC 1999»
13 years 8 months ago
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
Phil Nigh, David P. Vallett, Atul Patel, Jason Wri...
ITC
1999
IEEE
98views Hardware» more  ITC 1999»
13 years 8 months ago
A design diversity metric and reliability analysis for redundant systems
Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of...
Subhasish Mitra, Nirmal R. Saxena, Edward J. McClu...
ITC
1999
IEEE
107views Hardware» more  ITC 1999»
13 years 8 months ago
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming
A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high...
Han Bin Kim, Dong Sam Ha