ITC
2000
IEEE
13 years 8 months ago
2000
IEEE
ITC
2000
IEEE
13 years 8 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
We describe logic synthesis techniques for designing diverse implementations of combinational logic circuits in order to maximize the data integrity of diverse duplex systems in t...