ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper describes a method for automatically generating diagnostic programs for mixed-signal load boards. This procedure employs a statistical method of computing Mahalanobis D...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
In this paper we analyze the effects of transient faults (TFs) affecting the internal nodes of conventional latch structures and we propose a new latch design which allows to tole...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
The long term impact of MEMS technology will be in its ability to integrate novel sensing and actuation functionality on traditional computing and communication devices enabling t...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
We propose a procedure for designing an LFSRbased circuit for masking of unknown output values that appear in the output response of a circuit tested using LBIST. The procedure is...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Defect tolerance will become more important as feature sizes shrink closer to single digit nanometer dimensions. This is true whether the chips are manufactured using topdown meth...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...