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DAC
2005
ACM
11 years 19 days ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DAC
2004
ACM
11 years 19 days ago
Circuit-aware architectural simulation
Architectural simulation has achieved a prominent role in the system design cycle by providing designers the ability to quickly examine a wide variety of design choices. However, ...
Seokwoo Lee, Shidhartha Das, Valeria Bertacco, Tod...
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