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DAC
2004
ACM
10 years 3 months ago
Statistical timing analysis based on a timing yield model
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
Farid N. Najm, Noel Menezes
DAC
2004
ACM
10 years 3 months ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi
DAC
2003
ACM
10 years 3 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah
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