Sciweavers

    DAC
    2004
    ACM
    137views Computer Architecture» more  DAC 2004»
    Parametric yield estimation considering leakage variability
    13 years 9 months ago
    Parametric yield estimation considering leakage variability
    Download  domino.research.ibm.com
    Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
    Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.