ISLPED
2005
ACM
13 years 10 months ago
2005
ACM
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...