ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperature...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating...
ISCA
2005
IEEE
13 years 10 months ago
2005
IEEE
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
PRDC
2008
IEEE
13 years 11 months ago
2008
IEEE
Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse im...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
With the relentless scaling of semiconductor technology, the lifetime reliability of embedded multiprocessor platforms has become one of the major concerns for the industry. If th...
HIPEAC
2010
Springer
14 years 1 months ago
2010
Springer
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...