ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
TODAES
2002
13 years 4 months ago
2002
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
DATE
2000
IEEE
13 years 8 months ago
2000
IEEE
This paper presents a method for redundancy identification (RID) using multi-node logic implications. The algorithm discovers a large number of direct and indirect implications b...
GLVLSI
2010
IEEE
13 years 9 months ago
2010
IEEE
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...