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    DATE
    2007
    IEEE
    106views Hardware» more  DATE 2007»
    Low-cost protection for SER upsets and silicon defects
    13 years 11 months ago
    Low-cost protection for SER upsets and silicon defects
    Download  www.eecs.umich.edu
    Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
    Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
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