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VTS
2006
IEEE
108views Hardware» more  VTS 2006»
12 years 9 months ago
Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing
Abstract— Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integr...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris
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