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DSD
2006
IEEE
126views Hardware» more  DSD 2006»
11 years 11 months ago
Off-Line Testing of Delay Faults in NoC Interconnects
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimu...
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