HPCN
1995
Springer
13 years 7 months ago
1995
Springer
The performance of parallel computing systems is strongly dependent on the runtime behaviour of parallel programs. This paper describes a new approach to measure and analyze the ru...
EWSPT
1995
Springer
13 years 7 months ago
1995
Springer
Software development organizations are beginning to recognize that measurement is a prerequisite for systematic process improvement, and have started to measure their products and...
GECCO
2006
Springer
13 years 8 months ago
2006
Springer
In this paper, the issue of adapting probabilities for Evolutionary Algorithm (EA) search operators is revisited. A framework is devised for distinguishing between measurements of...
FORMATS
2006
Springer
13 years 8 months ago
2006
Springer
We consider interval measurement logic IML, a sublogic of Zhou and Hansen's interval logic, with measurement functions which provide real-valued measurement of some aspect of ...
HICSS
2009
IEEE
2009
IEEE
An Information Systems Design Product Theory for Software Project Estimation and Measurement Systems
13 years 8 months ago
: There is relatively little research on software Project Estimation and Measurement Systems (PEMS). Commercial PEMS vary in functionality and effectiveness. Their intended users t...
ICDCS
2010
IEEE
13 years 8 months ago
2010
IEEE
Abstract—We present results from measurements of the filtering of HTTP HTML responses in China, which is based on string matching and TCP reset injection by backbone-level route...
METRICS
1997
IEEE
13 years 8 months ago
1997
IEEE
Schlumberger RPS successfully applies software measurement to support their software development projects. It is proposed that the success of their measurement practices is mainly...
CSMR
1998
IEEE
13 years 8 months ago
1998
IEEE
Many organizations are using measurement as a means to improve their software development and maintenance processes. A reasonable consensus has been reached about the main success...
GI
2009
Springer
13 years 9 months ago
2009
Springer
: In many tracking applications, the extent of the target object is neglected and it is assumed that the received measurements stem from a point source. However, modern sensors are...
ATS
2002
IEEE
13 years 9 months ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...