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DATE
1999
IEEE
72views Hardware» more  DATE 1999»
12 years 4 months ago
On Programmable Memory Built-In Self Test Architectures
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The proposed microcode-based memory BIST unit is more e ci...
Kamran Zarrineh, Shambhu J. Upadhyaya
ITC
2003
IEEE
116views Hardware» more  ITC 2003»
12 years 5 months ago
BIST for Deep Submicron ASIC Memories with High Performance Application
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Ome...
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
13 years 11 days ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
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