ESA
2006
Springer
13 years 8 months ago
2006
Springer
We address the problem of sorting in the presence of faults that may arbitrarily corrupt memory locations, and investigate the impact of memory faults both on the correctness and ...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...