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DATE
2005
IEEE
96views Hardware» more  DATE 2005»
13 years 11 months ago
Framework for Fault Analysis and Test Generation in DRAMs
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. v...