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PACS
2000
Springer
118views Hardware» more  PACS 2000»
13 years 7 months ago
Ramp Up/Down Functional Unit to Reduce Step Power
Because the inductive noise Ldi/dt is induced by the power change and can have disastrous impact on the timing and reliability of the system, high-performance CPU designs are more ...
Zhenyu Tang, Norman Chang, Shen Lin, Weize Xie, O....
GLVLSI
2010
IEEE
156views VLSI» more  GLVLSI 2010»
13 years 8 months ago
A multi-level approach to reduce the impact of NBTI on processor functional units
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
Taniya Siddiqua, Sudhanva Gurumurthi