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137
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DATE
1999
IEEE
72
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DATE 1999
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On Programmable Memory Built-In Self Test Architectures
15 years 7 months ago
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www.cse.buffalo.edu
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The proposed microcode-based memory BIST unit is more e ci...
Kamran Zarrineh, Shambhu J. Upadhyaya
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