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ISAAC
2007
Springer
131views Algorithms» more  ISAAC 2007»
13 years 11 months ago
On the Fault Testing for Reversible Circuits
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
Satoshi Tayu, Shigeru Ito, Shuichi Ueno