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DFT
2008
IEEE
106views VLSI» more  DFT 2008»
13 years 11 months ago
Built-In Proactive Tuning System for Circuit Aging Resilience
VLSI circuits in nanometer VLSI technology experience significant aging effects, which are embodied by performance degradation over operation time. Although this degradation can b...
Nimay Shah, Rupak Samanta, Ming Zhang, Jiang Hu, D...