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DFT
2006
IEEE
85views VLSI» more  DFT 2006»
13 years 8 months ago
Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects
With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the pho...
Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim