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MICRO
2010
IEEE
153views Hardware» more  MICRO 2010»
13 years 2 months ago
AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering ...
Arun A. Nair, Lizy Kurian John, Lieven Eeckhout