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ISQED
2007
IEEE
135views Hardware» more  ISQED 2007»
9 years 7 months ago
MARS-S: Modeling and Reduction of Soft Errors in Sequential Circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
Natasa Miskov-Zivanov, Diana Marculescu
DAC
2006
ACM
10 years 2 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
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