TCAD
2008
13 years 4 months ago
2008
Abstract--In this paper, we present a postsilicon-tuning technique to improve parametric yield of SRAM array using body bias (BB). First, we show that, although parametric failures...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
ASPDAC
2006
ACM
13 years 8 months ago
2006
ACM
- Technology scaling and sub-wavelength optical lithography is associated with significant process variations. We propose a self-adaptive variable supply-voltage scaling (SAVS) tec...
DAC
1996
ACM
13 years 8 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exc...
CODES
2006
IEEE
13 years 10 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...