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    CODES
    2006
    IEEE
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    Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
    13 years 10 months ago
    Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
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    Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
    Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
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