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DATE
2002
IEEE
96views Hardware» more  DATE 2002»
13 years 10 months ago
Modeling Techniques and Tests for Partial Faults in Memory Devices
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
Zaid Al-Ars, A. J. van de Goor