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    DATE
    2005
    IEEE
    107views Hardware» more  DATE 2005»
    On Statistical Timing Analysis with Inter- and Intra-Die Variations
    13 years 10 months ago
    On Statistical Timing Analysis with Inter- and Intra-Die Variations
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    In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
    Hratch Mangassarian, Mohab Anis
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