EVOW
2008
Springer
13 years 6 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
ISSS
2000
IEEE
13 years 9 months ago
2000
IEEE
Various system-level core-based power evaluation approaches for core types like microprocessors, caches, main memories, and buses, have been proposed in the past. Approaches for o...