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HIPC
2009
Springer
13 years 2 months ago
Detailed analysis of I/O traces for large scale applications
- In this paper, we present a tool to extract I/O traces from very large applications running at full scale during their production runs. We analyze these traces to gain informatio...
Nithin Nakka, Alok N. Choudhary, Wei-keng Liao, Le...