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VLSID
2002
IEEE
122views VLSI» more  VLSID 2002»
14 years 4 months ago
Evaluating Run-Time Techniques for Leakage Power Reduction
While some leakage power reduction techniques require modification of process technology achieving savings at the fabrication stage, others are based on circuit-level optimization...
David Duarte, Yuh-Fang Tsai, Narayanan Vijaykrishn...