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    ISQED
    2000
    IEEE
    131views Hardware» more  ISQED 2000»
    Low Power Testing of VLSI Circuits: Problems and Solutions
    13 years 9 months ago
    Low Power Testing of VLSI Circuits: Problems and Solutions
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    Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
    Patrick Girard
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