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EURODAC
1995
IEEE
100views VHDL» more  EURODAC 1995»
13 years 8 months ago
A unified approach to the extraction of realistic multiple bridging and break faults
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...
Gerald Spiegel, Albrecht P. Stroele