Sciweavers

DELTA
2010
IEEE
13 years 9 months ago
A More Precise Model of Noise Based PCMOS Errors
—In this paper we present a new model for characterization of probabilistic gates. While still not mainstream, probabilistic CMOS has the potential to dramatically reduce energy ...
Arun Bhanu, Mark S. K. Lau, Keck Voon Ling, Vincen...