CCE
2004
13 years 4 months ago
2004
Early detection of process disturbances and prediction of malfunctions in process equipment improve the safety of the process, minimize the time and resources needed for maintenan...
DAC
1996
ACM
13 years 8 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...