HPCA
2011
IEEE
12 years 8 months ago
2011
IEEE
― Phase Change Memory (PCM) is one of the most promising technologies among emerging non-volatile memories. PCM stores data in crystalline and amorphous phases of the GST materia...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
CODES
2010
IEEE
13 years 2 months ago
2010
IEEE
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
ASPDAC
2005
ACM
13 years 6 months ago
2005
ACM
The synthesis of clock network in the presence of process variation is becoming a vital design issue towards the performance of digital circuits. In this paper, we propose a clock ...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
GLVLSI
2009
IEEE
13 years 8 months ago
2009
IEEE
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
DAC
2000
ACM
13 years 9 months ago
2000
ACM
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ISCAS
2003
IEEE
13 years 9 months ago
2003
IEEE
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and...