Sciweavers

VLSID
2003
IEEE
96views VLSI» more  VLSID 2003»
14 years 4 months ago
Design Of A Universal BIST (UBIST) Structure
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...