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    VLSID
    2007
    IEEE
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    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
    14 years 4 months ago
    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
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    Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
    Feng Wang 0004, Yuan Xie, R. Rajaraman, Balaji Vai...
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