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    ASPDAC
    2007
    ACM
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    Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM
    13 years 8 months ago
    Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM
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    - For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
    Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...
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