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    VLSID
    1993
    IEEE
    136views VLSI» more  VLSID 1993»
    A Simulation-Based Test Generation Scheme Using Genetic Algorithms
    13 years 9 months ago
    A Simulation-Based Test Generation Scheme Using Genetic Algorithms
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    This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
    M. Srinivas, Lalit M. Patnaik
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