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    DATE
    2006
    IEEE
    75views Hardware» more  DATE 2006»
    Space of DRAM fault models and corresponding testing
    13 years 10 months ago
    Space of DRAM fault models and corresponding testing
    Download  ce.et.tudelft.nl
    Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
    Zaid Al-Ars, Said Hamdioui, A. J. van de Goor
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