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    PROMISE
    2010
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    Exploiting count spectra for Bayesian fault localization
    12 years 11 months ago
    Exploiting count spectra for Bayesian fault localization
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    Background: Automated diagnosis of software defects can drastically increase debugging efficiency, improving reliability and time-to-market. Current, low-cost, automatic fault dia...
    Rui Abreu, Alberto González-Sanchez, Arjan ...
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